Victor Zieren

Victor Zieren received the MSc. E.E. degree from Delft University of Technology, The Netherlands, in 1979. In 1983, he received his PhD from the same university on a thesis devoted to magnetic vector sensors. In 1983 he joined Philips Research in Eindhoven, The Netherlands, and was involved in research on thin-film magnetic recording heads for perpendicular video tape recording and for electronic still-picture cameras using floppy disks. Between 1989 and 1994 he worked on multi-track thin-film read-write heads in cooperation with Seagate (USA). Between 1994 and 2004, his research was aimed at failure analysis (FA) of VLSI circuits and other electronic devices, developing spectral and backside photon-emission microscopy.  He also headed a research cluster involved in transient-current-based test techniques in deep-submicron integrated circuits, for which he received the Honorable Mention Paper Award of the IEEE International Test Conference in 1999. In 2004 and 2005 he was involved in the design and modelling of embedded SONOS-based non-volatile memories. In 2006 he was working on characterization of Geiger-Mode Avalanche Photodiodes for medical diagnostics equipment (Positron Emission Tomography).

In October 2006, he joined NXP and was involved in System Integrity Self Test (SIST) monitors in large system chips. Between 2009 and 2013 he was driving the CMOS magnetic-sensor R&D towards a magnetic 360° angular sensor. Currently he is investigating novel test methods for MicroController Units.

He is the author or co-author of about 60 journal and conference papers and holds 22 U.S. and numerous European and World Patents.